Cart (Loading....) | Create Account
Close category search window
 

Global stability analysis and stabilization of a class-E/F amplifier with a distributed active transformer

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

3 Author(s)
Sanggeun Jeon ; Dept. of Electr. Eng., California Inst. of Technol., Pasadena, CA, USA ; Suarez, A. ; Rutledge, D.B.

Power amplifiers (PAs) often exhibit instabilities giving rise to frequency divisions or spurious oscillations. The prediction of these instabilities requires a large-signal stability analysis of the circuit. In this paper, oscillations, hysteresis, and chaotic solutions, experimentally encountered in a high-efficiency class-E/Fodd PA with four transistors combined using a distributed active transformer, are studied through the use of stability and bifurcation analysis tools. The tools have enabled an in-depth comprehension of the different phenomena, which have been observed in simulation with good agreement with experimental results. The study of the mechanism generating the instability has led to a simplified equivalent circuit from which the optimum stabilization network has been determined. The network enables a global stabilization of the circuit for all the expected operating values of the amplifier bias voltage and input power. This has been achieved with negligible degradation of the amplifier performance in terms of drain efficiency and output power. The stable behavior obtained in simulation has been experimentally confirmed.

Published in:

Microwave Theory and Techniques, IEEE Transactions on  (Volume:53 ,  Issue: 12 )

Date of Publication:

Dec. 2005

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.