Close category search window
 

A study of combined field formulations for material scattering for a locally corrected Nyström discretization

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

3 Author(s)
Aiming Zhu ; Dept. of Electr. & Comput. Eng., Univ. of Kentucky, Lexington, KY, USA ; Gedney, S.D. ; Visher, J.L.

A study of the error convergence and condition number of three integral-equation formulations derived for penetrable material scattering objects-the Poggio, Miller, Chang, Harrington, Wu and Tsai (PMCHWT), the Müller, and the PMCHWT(-) formulations-is presented for a variety of problems when discretized via a locally corrected Nyström method. The PMCHWT formulation is a first-kind integral equation with a hypersingular operator. The Müller formulation leads to a second-kind equation consisting of a diagonal term plus a compact operator. This form is both frequency and mesh stable. However, unlike the PMCHWT formulation, the error grows with the refractive index. The PMCHWT(-) formulation is in the form of a second-kind equation, but has a hypersingular term.

Published in:
Antennas and Propagation, IEEE Transactions on  (Volume:53 ,  Issue: 12 )

Date of Publication: Dec. 2005

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2013 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.