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The rosetta experiment: atmospheric soft error rate testing in differing technology FPGAs

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5 Author(s)

Results are presented from real-time experiments that evaluated large field programmable gate arrays (FPGAs) fabricated in different CMOS technologies (0.15 μm, 0.13 μm, and 90 nm) for their sensitivity to radiation-induced single-event upsets (SEUs). These results are compared to circuit simulation (Qcrit) studies as well as to Los Alamos Neutron Science Center (LANSCE) neutron beam results and Crocker Nuclear Laboratory (University of California, Davis) cyclotron proton beam results.

Published in:

Device and Materials Reliability, IEEE Transactions on  (Volume:5 ,  Issue: 3 )

Date of Publication:

Sept. 2005

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