By Topic

2005 IEEE East-West Design and Test Workshop

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$33 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

1 Author(s)
Hahanov, V. ; Kharkov National University of Radioelectronics

The 3rd IEEE East-West Design and Test Workshop (EWDTW 2005) took place from 15 to 19 September in Odessa, Ukraine. The workshop's goal was for scientific schools and experts in Eastern and Western Europe (as well as other parts of the world) to exchange experiences in the design and test of electronic systems. Researchers from western countries presented an overview of design-and-test trends. André Ivanov gave a tutorial on network-on-chip design and test, and Yervant Zorian gave a tutorial on design for yield and reliability. Participants from Intel presented the invited talk, "Research at Intel's Strategic CAD Labs," which gave an overview of CAD research preformed at Intel's laboratories.

Published in:

Design & Test of Computers, IEEE  (Volume:22 ,  Issue: 6 )