By Topic

A novel transition fault ATPG that reduces yield loss

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

2 Author(s)
Liu, X. ; Texas Instrum. Inc., Dallas, TX, USA ; Hsiao, M.S.

In this article, we have presented a novel constrained broadside transition ATPG algorithm to avoid overtesting functionally (sequentially) untestable transition faults. In some circuits, significantly more functionally untestable transition faults were identified. At the same time, more faults could be detected without incidental detection of functionally untestable transition faults. With a test set that reduces launching of transitions that are functionally impossible, we believe our method offers a practical solution to avoid overtesting these functionally impossible transitions, thus reducing yield loss. However, the runtime for our constrained ATPG is much longer than the conventional ATPG as a result of the constraint learning and construction process. Our future work concentrates on more-efficient constraint learning algorithms to reduce the over all ATPG runtime.

Published in:

Design & Test of Computers, IEEE  (Volume:22 ,  Issue: 6 )