By Topic

Synthesis of low/zero index of refraction metamaterials from frequency selective surfaces using genetic algorithms

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$33 $31
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

2 Author(s)
Gingrich, M.A. ; Dept. of Electr. Eng., Pennsylvania State Univ., University Park, USA ; Werner, D.H.

Presented is a new means of synthesising thin, planar low or zero index metamaterials (LIM/ZIM) via frequency selective surfaces (FSS), the parameters of which are optimised using a genetic algorithm. FSS-based LIM/ZIM possess advantages such as light weight, ease of fabrication, low loss, and are readily scalable in frequency.

Published in:

Electronics Letters  (Volume:41 ,  Issue: 23 )