Cart (Loading....) | Create Account
Close category search window
 

Non-orthogonal binary subspace and its applications in computer vision

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

3 Author(s)
Hai Tao ; Dept. of Comput. Eng., California Univ., Santa Cruz, CA, USA ; Crabb, R. ; Feng Tang

This paper presents a novel approach that represents an image or a set of images using a non-orthogonal binary subspace (NBS) spanned by box-like base vectors. These base vectors possess the property that the inner product operation with them can be computed very efficiently. We investigate the optimized orthogonal matching pursuit method for finding the best NBS base vectors. It is demonstrated in this paper how the NBS based expansion can be applied to speed up several common computer vision algorithms, including normalized cross correlation (NCC), sum of squared difference (SSD) matching, appearance subspace projection and subspace-based object recognition. Promising experimental results on facial and natural images are demonstrated in this paper.

Published in:

Computer Vision, 2005. ICCV 2005. Tenth IEEE International Conference on  (Volume:1 )

Date of Conference:

17-21 Oct. 2005

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.