By Topic

Modeling of the behavior of random carbon nanotubes during field emission

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

2 Author(s)
Sinha, N. ; Dept. of Syst. Design Eng., Waterloo Univ., Ont., Canada ; Yeow, J.T.W.

Carbon nanotubes (CNTs) have emerged as promising electron emitters in recent years because of their low threshold electric field for emission and a high emission current density. These features make them attractive for many technological applications such as cold cathode electron sources for a variety of vacuum electronic devices. In this paper, we model the behavior of randomly oriented CNTs during field emission under the influence of external electric field.

Published in:

MEMS, NANO and Smart Systems, 2005. Proceedings. 2005 International Conference on

Date of Conference:

24-27 July 2005