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A software reliability growth model for an error-removal phenomenon

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2 Author(s)
P. K. Kapur ; Delhi Univ., India ; R. B. Garg

The authors develop a software reliability growth model based on the non-homogeneous Poisson process, under the assumption that the detection of these errors can also cause the detection of some of the remaining errors without these errors causing any failure. Using the expected number of errors thus detected, the authors obtain the mean value function describing the failure phenomenon. Parameters of the model are estimated, and the applicability of the model is illustrated. The authors discuss the optimal release policy for such a software reliability growth model based on the cost-reliability criterion. Predictive validity of the model is discussed, and numerical results are also presented.<>

Published in:

Software Engineering Journal  (Volume:7 ,  Issue: 4 )