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Compendia of radiation test results of integrated circuits

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5 Author(s)
P. Layton ; Maxwell Technol. Inc., San Diego, CA, USA ; E. Patnaude ; G. Williamson ; L. Longden
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Single event effects (SEE), total ionizing dose (TID) and radiation reliability data taken for existing space products is presented. The data was collected to evaluate these devices for radiation effects in space environments.

Published in:

IEEE Radiation Effects Data Workshop, 2005.

Date of Conference:

11-15 July 2005