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Single event upset characterization of the ESP603 single board space computer with the PowerPC603r processor using proton irradiation

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6 Author(s)
Rufenacht, H. ; EMS Technol. Canada Ltd., St. Anne de Bellevue, Que., Canada ; Hiemstra, D.M. ; Ronge, R. ; Klincsek, T.
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The proton induced SEU cross-sections measured in a dynamic test of the ESP603 Power PC 603r processor are presented. The cross-sections are used to estimate upset rates in the space radiation environment.

Published in:

Radiation Effects Data Workshop, 2005. IEEE

Date of Conference:

11-15 July 2005

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