By Topic

Single event upset characterization of the ESP603 single board space computer with the PowerPC603r processor using proton irradiation

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

6 Author(s)
Rufenacht, H. ; EMS Technol. Canada Ltd., St. Anne de Bellevue, Que., Canada ; Hiemstra, D.M. ; Ronge, R. ; Klincsek, T.
more authors

The proton induced SEU cross-sections measured in a dynamic test of the ESP603 Power PC 603r processor are presented. The cross-sections are used to estimate upset rates in the space radiation environment.

Published in:

Radiation Effects Data Workshop, 2005. IEEE

Date of Conference:

11-15 July 2005