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Part II. Dynamic single event upset characterization of the Virtex-II field programmable gate array using proton irradiation

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2 Author(s)
Hiemstra, D.M. ; MDA Corp., Brampton, Ont., Canada ; Chayab, F.

The proton induced dynamic SEU cross-section of additional functional blocks and reference designs on the Virtex-II FPGA are presented. The measured reference design cross-sections are compared with calculated cross-sections based on their functional block utilization. The reference designs upset cross-sections are used to estimate their upset rate in the space radiation environment.

Published in:

Radiation Effects Data Workshop, 2005. IEEE

Date of Conference:

11-15 July 2005

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