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Single event upset characterization of the SMJ320C6701 digital signal processor using proton irradiation

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3 Author(s)
Hiemstra, D.M. ; MDA Corp., Brampton, Ont., Canada ; Miladinovic, B. ; Chayab, F.

The proton induced SEU cross-section of the functional blocks of the SMJ320C6701 digital signal processor (DSP) are presented. The cross-sections are used to estimate the upset rates in the space radiation environment.

Published in:

Radiation Effects Data Workshop, 2005. IEEE

Date of Conference:

11-15 July 2005