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Test results of single-event effects conducted by the Jet Propulsion Laboratory

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2 Author(s)
Trom, F. ; Jet Propulsion Lab., California Inst. of Technol., Pasadena, CA, USA ; Miyahira, T.F.

This paper reports recent single-event effects results for a variety of microelectronic devices that include ADC, DAC, DDS, MOSFET driver, analog switch, oscillator, and zero delay buffer. The data was collected to evaluate these devices for possible use in NASA spacecraft. Six of ten devices under study were sensitive to SEL, and the latchup was destructive.

Published in:

Radiation Effects Data Workshop, 2005. IEEE

Date of Conference:

11-15 July 2005