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Recent single event effects results for candidate spacecraft electronics for NASA

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21 Author(s)
M. V. O'Bryan ; Muniz Eng. Inc., Greenbelt, MD, USA ; K. A. LaBel ; S. D. Kniffin ; C. Poivey
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Vulnerability of a variety of candidate spacecraft electronics to proton and heavy ion induced single event effects is studied. Devices tested include digital, linear bipolar, and hybrid devices.

Published in:

IEEE Radiation Effects Data Workshop, 2005.

Date of Conference:

11-15 July 2005