Referenced Items are not available for this document.
Recent SEE testing of 1M and 4M monolithic SRAMs at Brookhaven National Laboratories has shown an extreme sensitivity to single-event latchup (SEL). We have observed SEL at the minimum heavy-ion LET available at Brookhaven, 0.375 MeV-cm2/mg.
Published in:
Radiation Effects Data Workshop, 2005. IEEE
Date of Conference: 11-15 July 2005
- Page(s):
- 1 - 7
- Print ISBN:
- 0-7803-9367-8
- INSPEC Accession Number:
- 8748931
- Digital Object Identifier :
- 10.1109/REDW.2005.1532657
- Product Type:
- Conference Publications
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