Cart (Loading....) | Create Account
Close category search window
 

Object and topology extraction from remote sensing images

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

2 Author(s)
Maire, C. ; Remote Sensing Technol. Inst., German Aerosp. Center, Webling, Germany ; Datcu, M.

We present a complete processing line to generate an object based description of optical remote sensing (RS) images. A segmentation algorithm is used to generate a partition of regions and simplify the volume of data. Results are still at the pixel level. Based on topology analyses, a dynamical algorithm is proposed to retrieve, extract the segmented regions and encode them in a tree structure which describes their topological relations (adjacencies, inclusions). The overall collected information constitutes a consistent and independent database, generated efficiently on standard workstation. Many applications are possible, such as content based image retrieval, image description and compression, object classification or image-object fusion. A scenario is presented to emphasize interest of the method in the case of 3D visualization enhancement: image-objects are integrated on elevation data (digital elevation models, DEM) in order to generate more realistic rendering.

Published in:

Image Processing, 2005. ICIP 2005. IEEE International Conference on  (Volume:2 )

Date of Conference:

11-14 Sept. 2005

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.