Accurate modeling of noise in switched-C /spl Delta//spl Sigma/ analog-to-digital converters

An accurate physical model of switched-capacitor /spl Delta//spl Sigma/ analog-to-digital converters (ADCs) noise is presented. Noise artifacts for various ADC blocks are captured using simple equations. Model is verified against measured 0.25-/spl mu/m high dynamic range ADC test chip for a wireless receiver. Design guidelines based on the proposed model are discussed.