Close category search window
 

Design and analysis of a general recurrent neural network model for time-varying matrix inversion

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

2 Author(s)
Yunong Zhang ; Dept. of Electr. & Comput. Eng., Nat. Univ. of Singapore, Singapore ; Shuzhi Sam Ge

Following the idea of using first-order time derivatives, this paper presents a general recurrent neural network (RNN) model for online inversion of time-varying matrices. Different kinds of activation functions are investigated to guarantee the global exponential convergence of the neural model to the exact inverse of a given time-varying matrix. The robustness of the proposed neural model is also studied with respect to different activation functions and various implementation errors. Simulation results, including the application to kinematic control of redundant manipulators, substantiate the theoretical analysis and demonstrate the efficacy of the neural model on time-varying matrix inversion, especially when using a power-sigmoid activation function.

Published in:
Neural Networks, IEEE Transactions on  (Volume:16 ,  Issue: 6 )

Date of Publication: Nov. 2005

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2013 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.