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The RF spectrum of partially polarized light and its application to system characterization

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1 Author(s)
Eyal, A. ; Fac. of Eng., Tel Aviv Univ., Israel

Formalism for complete characterization of the RF spectrum of partially polarized light is described. The formalism is used to characterize the polarization dependence of the RF spectrum at the output of a PMD/PDL medium.

Published in:

LEOS Summer Topical Meetings, 2005 Digest of the

Date of Conference:

25-27 July 2005