Cart (Loading....) | Create Account
Close category search window
 

An efficient connectivity-number-based edge detection method for binary images

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

2 Author(s)
Wen-Ming Zhang ; Sch. of Mech. Eng., Xi''an Jiaotong Univ., China ; Sun-An Wang

A novel binary images edge detection method is presented. It directly clear the inner pixels of the images to obtain the edges. Connectivity-number were sought as detectors, those pixels that have zero-connectivity-number were eliminate as inner pixels from the image. Seventeen well-chosen templates change the computing into efficient exclusive or operations. Experimental results show that it provides less than 2-pixel-wide edges, spends average 8ms on the standard 256-by-256 Lena image. Considered the ratio of details and time consumed, the method shows improved performance than the well known Canny, Roberts and Sobel methods on binary images, and shows potential application on real-time edge detection for binary images.

Published in:

Machine Learning and Cybernetics, 2005. Proceedings of 2005 International Conference on  (Volume:9 )

Date of Conference:

18-21 Aug. 2005

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.