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Application-independent testing of FPGA interconnects

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2 Author(s)
M. B. Tahoori ; Center for Reliable Comput., Stanford Univ., CA, USA ; S. Mitra

We present a new automatic test-configuration-generation technique for application-independent manufacturing testing of the interconnection network of static-random-access-memory-based field programmable gate arrays (FPGAs). This technique targets detection of open and bridging faults in the wiring channels and programmable switches in the interconnects. Experimental results on Xilinx Virtex FPGAs show that very few test configurations are required to cover stuck-open, stuck-closed, open, and bridging faults in the interconnects.

Published in:

IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems  (Volume:24 ,  Issue: 11 )