By Topic

Measurements of real ESD threats have been ignored too long

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

1 Author(s)

Electrostatic discharge (ESD) protection circuits are built into every pin of an integrated circuit (IC) to protect the core operating circuits. Many different standards groups have assumed the responsibility of producing ESD testing standards for the IC industry. The quality of ESD testing and their standards have suffered from a lack of measurement updates without an effort for periodic investigations of the real threat from ESD. Measurements to determine the real parameters of ESD threat have been ignored for too long. The present tests and standards will continue because organized ESD experts in standards groups are unconcerned with the real threat and can ignore the new data we have measured.

Published in:

Instrumentation & Measurement Magazine, IEEE  (Volume:8 ,  Issue: 4 )