Cart (Loading....) | Create Account
Close category search window
 

Analysis of insulation failure modes in high power IGBT modules

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

3 Author(s)
Fabian, J.-H. ; Corp. Res., ABB Switzerland Ltd, Baden, Switzerland ; Hartmann, S. ; Hamidi, A.

Increasing operating voltages of insulated gate bipolar transistor (IGBT) modules results in higher demands on electrical insulation capabilities as well as partial discharge resistance. This paper discusses the insulation failure modes observed in high voltage power modules; most critical are water trees, partial discharge (PD) and electrical trees. Besides the review of insulation failure mechanisms, an experimental analysis method is discussed in order to identify possible failure source. Presented is a PD setup that includes a light sensitive CCD camera for optical inspection. Within the optical measurements, electroluminescence maps are also recorded in order to identify critical regions of high electrical fields. This method permits an analysis even before PD or electrical treeing begins. Optical PD inspections allow identifying PD failure root causes like protrusions or irregular edge shapes. In addition, investigations of PD failures on the ceramic substrate level have been performed and the distribution of inception voltages for one substrate type analyzed.

Published in:

Industry Applications Conference, 2005. Fourtieth IAS Annual Meeting. Conference Record of the 2005  (Volume:2 )

Date of Conference:

2-6 Oct. 2005

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.