Scheduled System Maintenance on May 29th, 2015:
IEEE Xplore will be upgraded between 11:00 AM and 10:00 PM EDT. During this time there may be intermittent impact on performance. We apologize for any inconvenience.
By Topic

Testing of very large systems: a hierarchical approach to fault coverage evaluation

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

3 Author(s)
Distante, F. ; Dipartimento di Elettronica, Politecnico di Milano, Italy ; Sami, M.G. ; Sciuto, D.

The authors consider general, uncommitted systems whose only particular characteristic is that of affording a hierarchical, structured organization. For such systems, they propose a graph-based representation of the testing problem. First, it is seen how such representation makes it possible to define the relationship between test vectors and faults at one abstraction level: then, a multiple-level extension is introduced. This multiple-level representation is used to evaluate the limits of test coverage that can be achieved when higher levels of abstraction are used and to introduce the definition of test procedures at a high abstraction level

Published in:

Wafer Scale Integration, 1991. Proceedings., [3rd] International Conference on

Date of Conference:

29-31 Jan 1991