IEEE.org| IEEE Xplore Digital Library| IEEE Standards| IEEE Spectrum| More Sites

Cart (Loading....) | Create Account | 

Close category search window
Author Searchbeta |  Advanced Search  |  Preferences |  Search Tips  |  More Search Options  
 
Browse Journals & Magazines > Instrumentation and Measureme ...> Volume:54 Issue:5 Help

Amplitude-only and complex field measurements for characterizing radiated fields of mobile terminal antennas from a small number of samples

Full Text Sign-In or Purchase

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing! close button
puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

4 Author(s)
Laitinen, T.A. ; Dept. of Electr. & Commun. Eng., Helsinki Univ. of Technol., Espoo, Finland ; Vainikainen, P. ; Tomi Koskinen, ; Kivekas, Outi

The capabilities of the Fourier transform and the spherical wave expansion-based techniques to determine the total radiated power and the radiation pattern of mobile phones from a relatively small number of amplitude-only and complex field values are compared. Several different simulation models of mobile phones beside a head phantom model in the frequency range 0.9-2.1 GHz are used as test cases. The results provide general guidelines for choosing a reasonable number of measurement directions for characterizing radiated fields of mobile phones. The results show that for a fixed, relatively small number of measurement directions, the complex field measurements provide lower uncertainty of the determination of the radiation pattern compared to the amplitude-only measurements.

Published in:
Instrumentation and Measurement, IEEE Transactions on  (Volume:54 ,  Issue: 5 )

Date of Publication: Oct. 2005

Page(s):
1989 - 1996
ISSN :
0018-9456
INSPEC Accession Number:
8601835
Digital Object Identifier :
10.1109/TIM.2005.853565
Product Type:
Journals & Magazines
Date of Current Version :
03 October 2005
Issue Date :
Oct. 2005
Sponsored by :
IEEE Instrumentation and Measurement Society

IEEE Account

Purchase Details

Profile Information

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2013 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.