By Topic

High impedance fault detection based on wavelet transform and statistical pattern recognition

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$33 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

4 Author(s)
A. -R. Sedighi ; Dept. of Electr. Eng., Tarbiat Modarres Univ., Tehran, Iran ; M. -R. Haghifam ; O. P. Malik ; M. -H. Ghassemian

A novel method for high impedance fault (HIF) detection based on pattern recognition systems is presented in this paper. Using this method, HIFs can be discriminated from insulator leakage current (ILC) and transients such as capacitor switching, load switching (high/low voltage), ground fault, inrush current and no load line switching. Wavelet transform is used for the decomposition of signals and feature extraction, feature selection is done by principal component analysis and Bayes classifier is used for classification. HIF and ILC data was acquired from experimental tests and the data for transients was obtained by simulation using EMTP program. Results show that the proposed procedure is efficient in identifying HIFs from other events.

Published in:

IEEE Transactions on Power Delivery  (Volume:20 ,  Issue: 4 )