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An integrated CAD environment for design of testable VLSI circuits

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3 Author(s)
S. Bhawmik ; Dept. of Comput. Sci. & Eng., Indian Inst. of Technol., Kharagpur, India ; T. K. Halder ; P. Palchaudhuri

The authors describe how the VLSI design process can be integrated under the object-oriented programming (OOP) paradigm with special emphasis on the design for testability (DFT) discipline. Such a design environment built around OOP can reduce the design turn-around time considerably while ensuring efficient management of vast and diverse design information. The various methods associated with the DFT object are being developed and interfaced to the VLSI circuit object system hierarchy by utilizing the facilities provided by the COPE language.<>

Published in:

Circuits and Systems, 1988., IEEE International Symposium on

Date of Conference:

7-9 June 1988