By Topic

A pattern analysis approach for topology determination, bad data correction and missing measurement estimation in power systems

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$33 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

3 Author(s)
A. P. Alves da Silva ; Dept. of Electr. & Comput. Eng., Waterloo Univ., Ont., Canada ; V. H. Quintana ; G. K. H. Pang

The authors propose a novel methodology for the combined solution of the topological identification, observability analysis and bad data processing problems in power systems. The idea is to provide, in a very fast way, a reliable input database for the state estimator, without interacting with it. The solution is based on a pattern analysis approach. An efficient framework for solving data acquisition and processing problems, joining pattern analysis and analytical procedures, is suggested. Two different techniques of pattern analysis are combined to produce a classifier and an estimator with unique characteristics to deal with noisy environments. The patterns required for the training process can be acquired from the SCADA (supervisory control and data acquisition) system and/or from load-flow simulations. Test results have been obtained for the IEEE 24-bus reliability test system

Published in:

Power Symposium, 1990., Proceedings of the Twenty-Second Annual North American

Date of Conference:

15-16 Oct 1990