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Enabling innovation in test manufacturing through ATE software standards

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2 Author(s)
Nageswaran, R. ; Intel Corp., Chandler, AZ ; Nelson, C.

Business influential Michael Porter theorized that standards based solutions are more cost-effective and efficient than proprietary alternatives when there is little "differentiating value" seen by the end user. Intel's aggressive adoption of 300 mm standards in wafer manufacturing and automated test equipment (ATE) automation standards in test manufacturing validates this premise. These standards have provided rapid, cost-effective factory integration and have enabled greater investment in manufacturing innovation. There are similar opportunities for ATE operating system (OS) software standards. This paper elaborates on the history and successes of ATE automation standards at Intel and future directions for ATE OS software standards in the industry

Published in:

Semiconductor Manufacturing, 2005. ISSM 2005, IEEE International Symposium on

Date of Conference:

13-15 Sept. 2005