Cart (Loading....) | Create Account
Close category search window
 

Search for an optimal rapid charging pattern for lithium-ion batteries using ant colony system algorithm

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

3 Author(s)
Yi-Hwa Liu ; Dept. of Electr. Eng., Chang-Gung Univ., Taoyuan, Taiwan ; Jen-Hao Teng ; Yu-Chung Lin

Commercial lithium-ion batteries are playing important roles as supplies for mobile phones, laptop computers, and other electronics. In order to maximize the performance of lithium-ion batteries, an advanced rapid charging pattern is required. In this paper, an Ant-Colony-System (ACS)-based algorithm is presented. The proposed ACS-based algorithm can be integrated into a commercially available battery tester to search for the optimal rapid charging pattern. Experimental results show that the obtained rapid charging pattern is capable of charging the lithium-ion batteries to 70% capacity in 30 min. The obtained pattern also provides 25% more cycle life than the conventional constant current-constant voltage method.

Published in:

Industrial Electronics, IEEE Transactions on  (Volume:52 ,  Issue: 5 )

Date of Publication:

Oct. 2005

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.