Cart (Loading....) | Create Account
Close category search window

Monte Carlo multi-robot localization based on grid cells and characteristic particles

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

4 Author(s)
Juncheng Liu ; Inst. of Autom., Chinese Acad. of Sci., Beijing ; Kui Yuan ; Wei Zou ; Qinmin Yang

In this paper, a Monte Carlo method based approach for multi-robot localization is described. In this approach, grid cells are used to describe the whole particle set which is used in MCL method to estimate the pose of robot. Then, the sizes of the grid cells are adjusted to capture the characteristic particles that can represent the property of all particles. The characteristic particles can be used to estimate the robot's position in its operation space. Because the number of the characteristic particles is much less than that of the total particles, this approach can reduce the computing time greatly. Simulation results are also given to show that this approach can obtain good localization performance in multi-robot system

Published in:

Advanced Intelligent Mechatronics. Proceedings, 2005 IEEE/ASME International Conference on

Date of Conference:

24-28 July 2005

Need Help?

IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.