Cart (Loading....) | Create Account
Close category search window

Fault detection and isolation for unknown nonlinear systems using expert methods

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

3 Author(s)
Khosravi, A. ; Dept. of Electr. Eng., Amirkabir Univ. of Technol., Tehran ; Talebi, H.A. ; Karrari, M.

In this paper a new comprehensive method for fault detection and isolation (FDI) for unknown nonlinear systems is presented. This method detects and eliminates sensor and actuator faults, as well as plant's component faults. Fault type and location are precisely determined using sensor measurements and controller signals. Fault magnitude of sensor and actuator gain/bias faults is estimated using neuro-fuzzy models and gradient descent method. A fuzzy compensator with an adaptive output gain accommodates the faults and eliminates their effects for a wide range of plant's components. Simulation results on a two-link rigid planar manipulator demonstrate the capability of the proposed technique for detection, diagnosis and accommodation of faults

Published in:

Control Applications, 2005. CCA 2005. Proceedings of 2005 IEEE Conference on

Date of Conference:

28-31 Aug. 2005

Need Help?

IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.