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Improved Y-factor method for wide-band on-wafer noise-parameter measurements

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4 Author(s)
Tiemeijer, L.F. ; Philips Res. Labs., Eindhoven, Netherlands ; Havens, R.J. ; de Kort, R. ; Scholten, A.J.

A new noise-figure measurement method, which combines the simplicity of the "classical" Y-factor method with the accuracy of the widely used "cold noise-source" method, is reported. Implemented in our fully automated wide-band 1-18-GHz on-wafer noise-parameter measurement system, accurate results are obtained using a small set of precharacterized source impedances. We illustrate our method and its accuracy with data taken on a low-noise GaAs pseudomorphic high electron-mobility transistor device, and quantify the impact of the instrumental uncertainties on the extracted noise parameters.

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Microwave Theory and Techniques, IEEE Transactions on  (Volume:53 ,  Issue: 9 )