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Power reflection coefficient analysis for complex impedances in RFID tag design

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6 Author(s)
P. V. Nikitin ; Intermec Technol. Corp., Everett, WA, USA ; K. V. S. Rao ; S. F. Lam ; V. Pillai
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Kurokawa's method of calculating the power reflection coefficient from the Smith chart in the situation when one complex impedance is directly connected to another is applied to passive RFID tag design, where power reflection is important, as it determines the tag characteristics. The performance analysis of a specific RFID tag is presented together with experimental data, which is in close agreement with the theory.

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IEEE Transactions on Microwave Theory and Techniques  (Volume:53 ,  Issue: 9 )