Cart (Loading....) | Create Account
Close category search window

Nonlinear modeling and analysis of resonant inverter tuning loops with voltage-pump phase-frequency detector

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

2 Author(s)
Karaca, H. ; Dept. of Electr. & Electron. Eng., Dokuz Eylul Univ., Izmir, Turkey ; Kilinc, S.

In this paper, a nonlinear model for large signal analysis of resonant inverter (RI) tuning loops with voltage-pump phase-frequency detector is presented. The proposed model employs the resistance multiplication approach, applicable for the circuits containing periodically operated switch. The generic model is valid for both positive and negative phase error values with slight differences. Transient and stability analysis of an RI tuning loop is carried out by employing the presented model. Time-domain expressions for any initial condition are derived as the result of transient analysis. On the other hand, stability analysis reveals the conditions that make the overall system stable. Experimental results, which confirm the theoretical study, are obtained.

Published in:

Power Electronics, IEEE Transactions on  (Volume:20 ,  Issue: 5 )

Date of Publication:

Sept. 2005

Need Help?

IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.