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A New Approach to Failure Analysis and Yield Enhancement of Very Large-scale Integrated Systems

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3 Author(s)
S. Amakawa ; University of Cambridge, United Kingdom ; N. Nakazato ; H. Mizuta

First Page of the Article

Published in:

Solid-State Device Research Conference, 2002. Proceeding of the 32nd European

Date of Conference:

24-26 September 2002