By Topic

MOS Memory Using Silicon Nanocrystals Formed by Very-Low Energy Ion Implantation

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$33 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

9 Author(s)
Kapetanakis, E. ; NCSR Demokritos, Aghia Paraskevi, Greece ; Normand, P. ; Tsoukalas, D. ; Kamoulakos, G.
more authors

Published in:

Solid-State Device Research Conference, 2000. Proceeding of the 30th European

Date of Conference:

11-13 September 2000