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EM and substrate coupling in silicon RFICs

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4 Author(s)
R. Amaya ; Dept. of Electron., Carleton Univ., Ottawa, Ont., Canada ; P. H. R. Popplewell ; M. Cloutier ; C. Plett

An investigation of coupling between inductors and resonators fabricated in silicon substrates is presented and the effects on RF systems and components are discussed. A novel experimental technique to measure inductor and resonator coupling is presented. The experiment is extremely sensitive, fast, accurate, and unique in that no matching, probe de-embedding, or calibration is necessary as the ratio of two on-chip signals is measured to yield the results.

Published in:

IEEE Journal of Solid-State Circuits  (Volume:40 ,  Issue: 9 )