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A sensitivity-based approach to analyzing signal delay uncertainty of coupled interconnects

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2 Author(s)
M. Kulkarni ; Sun Microsystems, Sunnyvale, CA, USA ; T. Chen

Performance optimization is a critical step in the design of integrated circuits. Rapid advances in very large scale integration (VLSI) technology have enabled shrinking feature sizes, wire widths, and wire spacings, making the effects of coupling capacitance more apparent. As signals switch faster, noise due to coupling between neighboring wires becomes more pronounced. Changing the relative signal arrival times (RSATs) alters the victim line delay due to the varying coupling noise on the victim line. The authors propose a sensitivity-based method to analyze delay uncertainties of coupled interconnects due to uncertain signal arrival times at its inputs. Compared to existing methods of analyzing delay uncertainties of coupled interconnects, the simulation results show that the proposed method strikes a good balance between model accuracy and complexity compared to the existing approaches.

Published in:

IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems  (Volume:24 ,  Issue: 9 )