By Topic

Extension of a full-wave layered interconnect simulator (UA-FWLIS) to handle lossy interconnects

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$33 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

5 Author(s)
Yi Cao ; Dept. of Electr. & Comput. Eng., Arizona Univ., Tucson, AZ, USA ; Zhaohui Zhu ; Xing Wang ; S. L. Dvorak
more authors

In this paper, we discuss the enhancement of a MoM-based full-wave layered interconnect simulator (UA-FWLIS) so that it can handle conductor losses. By introducing an effective surface current and a surface impedance, the losses on the interconnects can be easily included in UA-FWLIS by adding an extra term to the reaction elements. Thus, the approach for analytically calculating the integrals in the reaction matrix, which uses readily computable ILHIs and residue theory, is still valid and the efficiency of UA-FWLIS can be retained. Comparing the S-parameter results from UA-FWLIS with those from Agilent Momentum validates the accuracy of the enhanced UA-FWLIS.

Published in:

Proceedings. 9th IEEE Workshop on Signal Propagation on Interconnects, 2005.

Date of Conference:

10-13 May 2005