By Topic

Online selection of discriminative tracking features

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$33 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

3 Author(s)
R. T. Collins ; Dept. of Comput. Sci. Eng., Pennsylvania State Univ., University Park, PA, USA ; Yanxi Liu ; M. Leordeanu

This paper presents an online feature selection mechanism for evaluating multiple features while tracking and adjusting the set of features used to improve tracking performance. Our hypothesis is that the features that best discriminate between object and background are also best for tracking the object. Given a set of seed features, we compute log likelihood ratios of class conditional sample densities from object and background to form a new set of candidate features tailored to the local object/background discrimination task. The two-class variance ratio is used to rank these new features according to how well they separate sample distributions of object and background pixels. This feature evaluation mechanism is embedded in a mean-shift tracking system that adaptively selects the top-ranked discriminative features for tracking. Examples are presented that demonstrate how this method adapts to changing appearances of both tracked object and scene background. We note susceptibility of the variance ratio feature selection method to distraction by spatially correlated background clutter and develop an additional approach that seeks to minimize the likelihood of distraction.

Published in:

IEEE Transactions on Pattern Analysis and Machine Intelligence  (Volume:27 ,  Issue: 10 )