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A Precise Cyclic CMOS Time-to-Digital Converter With Low Thermal Sensitivity

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4 Author(s)
Chen, Chun-Chi ; Dept. of Electron. Eng., Nat. Taiwan Univ. of Sci. & Technol., Taipei, Taiwan ; Poki Chen ; Chorng-Sii Hwang ; Wei Chang

In this paper, a precise cyclic CMOS time-to-digital converter (TDC) with low thermal sensitivity is proposed. Through compensation, the thermal sensitivity of the new cyclic time-to-digital converter is reduced dramatically. The proposed TDC not only possesses reduced thermal sensitivity but also has a small chip size. The circuit was fabricated with TSMC 0.35 \mu m CMOS technology. The size of the circuit is only 0.40 mm by 0.30 mm. The experimental results show that a \pm 6% resolution variation of the new TDC was achieved over 0 ,^\circ\hbox {C} to 100 ,^\circ\hbox {C} temperature range which is much better than the \pm 25% resolution variation of the original uncompensated version. The effective resolution is as fine as 57.3ps/LSB at room temperature with a fluctuation of \pm 3.5 ps over 0 ,^\circ\hbox {C} to 100 ,^\circ\hbox {C} temperature range, and the corresponding integral nonlinearities are all within \pm 0.8 LSB. The minimum measurement rate is 33 kHz. The measured power consumption is about 3.5 uW.

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Nuclear Science, IEEE Transactions on  (Volume:52 ,  Issue: 4 )