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Mechanism of on-current and off-current instabilities under electrical stress in polycrystalline silicon thin-film transistors

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4 Author(s)
Shen De Wang ; Inst. of Electron., Nat. Chiao-Tung Univ., Hsin-Chu, Taiwan ; Tzu Yun Chang ; Wei Hsiang Lo ; Tan Fu Lei

First Page of the Article

Published in:

2005 IEEE International Reliability Physics Symposium, 2005. Proceedings. 43rd Annual.

Date of Conference:

April 17-21, 2005