By Topic

Design and Validation of a Power Supply Noise Reduction Technique

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$33 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

3 Author(s)
Gang Ji ; Intel Corp., Santa Clara, CA, USA ; T. R. Arabi ; G. Taylor

For the high-performance microprocessors with high-bandwidth I/O, the power supply noise needs to be controlled to ensure reliable high speed bus operation. This is generally done with high-quality package capacitors. These capacitors are generally lower equivalent series inductance (ESL) and lower equivalent series resistor (ESR). In this paper, we will present two implementations of an approach of using on-die resistors in series with the package capacitance to dampen the high-frequency noise. We will show by validation on the 90-nm technology that this technique is capable of reducing the noise by nearly 80% without adversely affecting the timings. The results of several validation experiments, including the measurement of noise and impedance of the I/O power delivery, and the post-layout simulation will also be presented.

Published in:

IEEE Transactions on Advanced Packaging  (Volume:28 ,  Issue: 3 )