Close category search window
 

Piezoresistive Accelerometers for MCM-Package—Part II: The Packaging

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

4 Author(s)
Cabruja, E. ; Centre Nacional de Microelectron. CSIC, Cerdanyola Del Valles, Spain ; Collado, A. ; Plaza, J.A. ; Esteve, J.

This paper is the second part of a twofold work related to the full integration of piezoresistive accelerometers in a multichip modules-deposited (MCM-D) type with flip-chip interconnection package. This part is fully devoted to the packaging of an accelerometer with movable parts in an MCM so a description of the package fabrication is given. The accelerometer was designed taking into account its final package and, therefore, some modifications to the standard piezoresistive accelerometer were done. In particular, a sealing ring was defined around the movable parts of the sensor in order to protect them from the underfill used during the final packaging process. This underfill is being studied at the moment so the tests performed have been without taking into account its effects. After the manufacturing step the MCM packaged accelerometers are attached to a PLCC44 substrate and characterized. The results show an improvement on the sensors performance when using the MCM solution in comparison to the accelerometers packaged in standard TO-8. The results show that the influence of the packaging technique on the final stress of the sensors is negligible. They also show an extra damping due to the confined air volume around the swinging proof mass of the accelerometers. The quality factor of the TO-8 packaged accelerometers is of 12 whereas for the MCM packaged devices is of 1, 2. This low-quality factor is of great interest for applications where the devices can suffer large acceleration changes. Finally, the results are in good agreement with the FEM simulations previously done and they demonstrate the viability of this technology.hfillhbox[1376]

Published in:
Microelectromechanical Systems, Journal of  (Volume:14 ,  Issue: 4 )

Date of Publication: Aug. 2005

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2013 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.