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Adding value to design and test through education: What are the challenges?

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1 Author(s)
L. Carro ; Federal University of Rio Grande do Sul

THE 6TH IEEE Latin American Test Workshop (LATW 05), took place from 30 March to 2 April 2005 in Salvador, Brazil. The workshop included a panel discussion on the challenges for modern design and test education, which attracted much attention from the audience.

Published in:

IEEE Design & Test of Computers  (Volume:22 ,  Issue: 4 )