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Modeling and analysis of parametric yield under power and performance constraints

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4 Author(s)
Rao, R.R. ; Michigan Univ., Ann Arbor, MI, USA ; Blaauw, D. ; Sylvester, D. ; Devgan, A.

Leakage current is a stringent constraint in today's ASIC designs. Effective parametric yield prediction must consider leakage current's dependence on chip frequency. The authors propose an analytical expression that includes both subthreshold and gate leakage currents. This model underlies an integrated approach to accurately estimating yield loss for a design with both frequency and power limits.

Published in:

Design & Test of Computers, IEEE  (Volume:22 ,  Issue: 4 )