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A reconfiguration-based defect-tolerant design paradigm for nanotechnologies

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3 Author(s)
Chen He ; Dept. of Electr. & Comput. Eng., Texas Univ., Austin, TX, USA ; Jacome, M.F. ; de Veciana, G.

This article discusses a novel probabilistic design paradigm targeting reconfigurable architected nanofabrics and points to a promising foundation for comprehensively addressing, at the system level, the density, scalability, and reliability challenges of emerging nanotechnologies. The approach exposes a new class of yield, delay, and cost trade-offs that must be jointly considered when designing computing systems in defect-prone nanotechnologies.

Published in:

Design & Test of Computers, IEEE  (Volume:22 ,  Issue: 4 )